330130-075-00-05近場(chǎng)探頭是一種能夠同時(shí)測(cè)量和探測(cè)物體電場(chǎng)和磁場(chǎng)的重要工具,其廣泛應(yīng)用于無(wú)線通信、射頻技術(shù)、電子設(shè)備測(cè)試以及醫(yī)學(xué)等領(lǐng)域。
近場(chǎng)探頭在多個(gè)領(lǐng)域中都有廣泛的應(yīng)用,包括但不限于以下場(chǎng)景:
無(wú)線通信測(cè)試:近場(chǎng)探頭可以測(cè)量無(wú)線通信設(shè)備發(fā)射的輻射功率和頻率。這對(duì)于保證信號(hào)質(zhì)量、減少電磁污染、確保設(shè)備安全性非常重要。
電磁兼容性測(cè)試:近場(chǎng)探頭可以對(duì)電子設(shè)備進(jìn)行電磁兼容性(EMI)測(cè)試,檢測(cè)設(shè)備是否會(huì)干擾其他設(shè)備或受到外部干擾。通過(guò)測(cè)試電磁輻射和傳導(dǎo)信號(hào),可以評(píng)估設(shè)備的抗干擾能力,提高設(shè)備的可靠性和穩(wěn)定性。
故障排查和分析:近場(chǎng)探頭可以用于故障排查和分析,通過(guò)測(cè)量輻射和傳導(dǎo)信號(hào),可以快速定位和診斷電磁故障。例如,在電路板上,可以通過(guò)探測(cè)信號(hào)的變化確定故障的位置或原因,從而進(jìn)行修復(fù)或改進(jìn)。
電磁波輻射防護(hù):近場(chǎng)探頭可以用來(lái)評(píng)估、設(shè)計(jì)和改進(jìn)電磁波輻射防護(hù)方案。通過(guò)測(cè)量電磁輻射的強(qiáng)度和頻率,可以確定哪些部分需要加強(qiáng)屏蔽措施,從而減少人員暴露在電磁輻射環(huán)境中的風(fēng)險(xiǎn)。
醫(yī)學(xué)領(lǐng)域:近場(chǎng)探頭還可以用于醫(yī)學(xué)領(lǐng)域的生物電信號(hào)檢測(cè)和研究。通過(guò)將近場(chǎng)探頭放置在人體表面附近,可以實(shí)時(shí)監(jiān)測(cè)和記錄人體內(nèi)部的電生理信號(hào),如心電圖、腦電圖等。這些信號(hào)的分析和研究對(duì)于疾病的診斷和治療具有重要意義。

330130-075-00-05
330130-075-00-05 Near field probe is an important tool that can simultaneously measure and detect electric and magnetic fields of objects, which is widely used in wireless communication, radio frequency technology, electronic equipment testing and medical fields.
Near-field probes have a wide range of applications in several fields, including but not limited to the following scenarios:
Wireless communication test: The near-field probe can measure the radiation power and frequency emitted by wireless communication devices. This is very important to ensure signal quality, reduce electromagnetic pollution, and ensure equipment safety.
Electromagnetic compatibility testing: Near-field probes can perform electromagnetic compatibility (EMI) tests on electronic devices to detect whether the device interferes with other devices or is subject to external interference. By testing electromagnetic radiation and conducted signals, the anti-interference ability of the equipment can be evaluated, and the reliability and stability of the equipment can be improved.
Troubleshooting and analysis: Near-field probes can be used for troubleshooting and analysis to quickly locate and diagnose electromagnetic faults by measuring radiation and conducted signals. For example, on a circuit board, the location or cause of the fault can be determined by detecting changes in the signal, so that repairs or improvements can be made.
Electromagnetic radiation protection: Near-field probes can be used to evaluate, design and improve electromagnetic radiation protection schemes. By measuring the intensity and frequency of electromagnetic radiation, it is possible to determine which parts need enhanced shielding measures, thereby reducing the risk of exposure to electromagnetic radiation in the environment.
Medical field: The near-field probe can also be used for bioelectrical signal detection and research in the medical field. By placing the near-field probe near the human body surface, the electrophysiological signals inside the human body can be monitored and recorded in real time, such as electrocardiogram, electroencephalogram, etc. The analysis and study of these signals are of great significance for the diagnosis and treatment of diseases.
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XVME-212/2 | CI854B? 3BSE069449R1 | TRICONEX 3805E | E5EAA HENF105240R1 | 3KDE175532L9300 |
XVME-212/1 | CI854A 3BSE030220R1 | 3BSE088382R1 | G3EA HENF315754R1 | AO920S |
XVME-201 | CI853 3BSE018103R1 | PM863K01 | G3EB HENF315768R1 | 3KDE175531L9200 |
XVME-530 | TB840A? 3BSE037760R1 | 3BSEO88381R1 | G3EFa HENF450295R2 | AO920N |
XVME-220 | TB826 3BSE061637R1 | PM862K02 | G3ENa HENF450268R2 | 3KDE175533L9200 |
XVME-110 | TB825? 3BSE036634R1 | 3BSE081636R1 | 3KDE175361L9100 | AO920B |
XVME-977 | TB820V2 3BSE013208R1 | PM862K01 | DP910N | 3KDE175532L9200 |
XVME-210 | CI845 3BSE075853R1 | 3BSE076940R1 | 3KDE175363L9100 | DO930N |
XVME-103 | CI840A? 3BSE041882R1 | PM861AK02 | DP910B | 3BDS014114 |